Improving sensitivity of a small angle x-ray scattering camera with pinhole collimation using separated optical elements
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چکیده
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Analysis of small-angle X-ray scattering data in the presence of significant instrumental smearing
A laboratory-scale small-angle X-ray scattering instrument with pinhole collimation has been used to assess smearing effects due to instrumental resolution. A new, numerically efficient method to smear ideal model intensities is developed and presented. It allows for directly using measured profiles of isotropic but otherwise arbitrary beams in smearing calculations. Samples of low-polydispersi...
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